top of page
Galaxy Dual Controller

Galaxy Dual Controller
Discover New Possibilities for the AFMs

A Second Life For Your Existing AFM System

Upgrade your AFM capabilities with the Galaxy Dual Controller—a breakthrough solution compatible with Multimode, 5100, 5500, 5600LS, and 54xx AFM/STM platforms. This advanced controller system not only modernizes your existing microscope but also introduces enhanced functionality for expanded research applications.

Key Features

Seamless Compatibility:

  • Technical expertise operating diverse AFM/SPM systems including Multimode AFM, Pico SPM (STM), and Agilent/Keysight scanning probe microscopes (5100, 5500, 5600LS, and 54xx models)

  • Maintains existing modes: STM, Contact, AC, Phase, MFM, EFM, PFM, LFM, EC modes

Advanced New Modes for your old AFM

  • HD-KFM: No lift, higher sensitivity & resolution

  • ResiScope & Soft ResiScope: Resistance & current measurements from 10² to 10¹² ohms and 50 fA to mA range, even on soft samples

  • Soft Intermittent Contact Mode: Measure adhesion, stiffness, Young's modulus with quantitative accuracy

High-Performance Hardware:

  • Real integrated lock-in for enhanced measurement capabilities

  • Low-noise electronics and power supply

  • USB 24-bit drive architecture for high resolution and smart integration

User-Friendly Software

  • Intuitive NanoSolution interface

  • One-click mode selection and automatic electronics configuration

  • Guided workflow for efficient image acquisition

  • Auto-settings for quick results and expert controls for in-depth analysis

Galaxy Dual Software
galaxy dual sw

Upgrade Your Research Capabilities

HD-KFM Mode:

  • Achieve higher sensitivity and resolution in Kelvin Probe Force Microscopy

  • Perfect for advanced materials research, including 2D materials like graphene

Learn more about the HD-KFM Mode

ResiScope Mode:

  • Wide-range resistance and current mapping

  • Ideal for semiconductor research, dopant profiling, and nanoelectronics

Learn more about the ResiScope mode

Soft Intermittent Contact Mode:

  • Non-destructive analysis of soft and delicate samples

  • Quantitative measurements of mechanical properties

Learn more about the Soft IC Mode

Cost-Effective: Significantly enhance your AFM capabilities without the expense of a new system

Expand Research Horizons: Access new modes and measurements previously unavailable on your AFM

Improve Efficiency: User-friendly software streamlines your workflow and reduces learning curve

Future-Proof Your Lab: Stay competitive with cutting-edge AFM technology

Why Upgrade with Galaxy Dual Controller?

Don't let your valuableAFM become obsolete.Upgrade with theGalaxy Dual Controllerand unlocknew researchpossibilities today.

Contact us

I am interested in...
bottom of page