2D Materials AFM Scan Results

Our Nano-Observer AFM series is a cutting-edge solution for the analysis of 2D materials like graphene, hBN, and transition metal dichalcogenides. It offers unparalleled precision in characterizing surface morphology, mechanical properties, and electrical behavior at the nanoscale. With advanced modes such as HD-KFM III and ResiScope, it enables detailed investigations of these materials' unique properties, supporting both fundamental research and industrial development in nanotechnology and advanced material applications.

Images

Graphene Sample on Si

HD-KFM Mode
Surface Potential Measurement
Scan size: 20x20 microns

Hexagonal boron nitride (hBN)

10 microns size HD-KFM III and PFM measurement of a folded hBN device. Topography shows that surface is atomically flat, while surface potential shows regions with characteristic moiré patterns. This patterns indicate the presence of domains with parallel alignment of the polarization vector. The visible contrast in the SP domains is compatible with AB and BA atomic arrangement (see inset). Alternatively PFM measurement also shows similar characteristic Moiré pattern.

Hexagonal boron nitride (hBN)

HD-KFM scans of hexagonal boron nitride (hBN) were performed, starting with a 25x25 µm area, followed by a 10x10 µm region, and finally zooming into a 4x4 µm spot. The last scan clearly shows Moiré pattern with triangular domains of ~100nm.

Hexagonal Graphene Flakes

Resonante Mode image (3 micron size- phase channel) of a SiO2 substrate (red area) with hexagonal graphene flakes. (green domains) on some of the flakes a second hexagonal monolayer is measured (blue areas)