.png)
EZ Temperature: Precision Thermal Control
Advanced Temperature-Controlled AFM Measurements
The EZ Temperature accessory, developed by CSInstruments for the Nano-Observer AFM, delivers precise temperature control and stable imaging during temperature changes. This powerful addition to your AFM setup opens new possibilities for studying temperature-dependent phenomena at the nanoscale.
Key Features
-
Wide Temperature Range: From -40°C to 300°C
-
Compatibility: Works with all AFM modes
-
Minimal Thermal Drift: Optimized design reduces temperature gradients
-
Stable Imaging: Maintain high-quality scans during temperature changes
-
Versatile Applications: Ideal for polymers, materials science, and biological samples
-
Seamless Integration: Designed specifically for the Nano-Observer AFM
Real time aquisition, Polymer cystallization 10 µm
Benefits of EZ Temperature Module
-
Limited Thermal Expansion: Minimized drift for stable imaging
-
Low Temperature Capability: Expand your research with different temperature conditions
-
Thermal Insulation: Protect sensitive AFM components
-
Precise Temperature Control: Achieve accurate and reproducible thermal conditions
-
Real-Time Imaging: Observe dynamic processes during temperature changes
-
Versatile Compatibility: Works with various modes and environmental controls
Temperature : 70°C to 40°C
Resonant mode
PCL (polycaprolactone) crystallization under controlled temperature
Scan size : 20µm