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Electric Force Microscopy (EFM)
Unveiling Nanoscale Electric Field Distributions
Electric Force Microscopy (EFM) is an advanced Atomic Force Microscopy (AFM) technique that allows for high-resolution mapping of electric field gradients at the nanoscale. This powerful mode is crucial for studying a wide range of materials and devices, offering unprecedented insights into their electrical properties and behavior.
Key Features
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High Sensitivity: Detect even the smallest variations in electric field gradients
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Excellent Spatial Resolution: Achieve lateral resolution down to a few nanometers
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Non-Destructive Imaging: Ideal for delicate or sensitive samples
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Quantitative Measurements: Map relative strengths of electric fields across surfaces
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Integration with Other Modes: Combine EFM with topography, mechanical, or other electrical modes for comprehensive analysis
Graphene Scan Result with EFM 10 µm scan
2 Nanotubes network deposited between 2 electrodes, EFM mode, 65µm scan
EFM Mode
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Superior Resolution: Our advanced EFM implementation offers unparalleled spatial resolution and sensitivity.
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User-Friendly Interface: Intuitive software makes EFM accessible to both experts and beginners.
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Versatility: Easily combine EFM with other AFM modes for comprehensive sample characterization.
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Cutting-Edge Research: Stay at the forefront of nanoscale electrical characterization with our continuously updated technology.
