CSI-AFM | Advanced Atomic Force Microscopy by CSInstruments

Advanced Atomic Force Microscopy Systems by CSInstruments

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Nano-Observer
Atomic Force Microscopy Systems

From routine surface characterization to advanced nanomechanical studies,

CSInstruments' AFM lineup is built for cutting-edge research.

Nano-Observer II

The next generation of high-performance AFM. Engineered for advanced applications demanding the highest precision & high-resolution imaging, complex nanomechanical analysis, and frontier materials research.

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Nano-Observer One Plus

Reliable choice for everyday surface characterization. Versatile and built for daily use across a wide range of surface characterization applications, without sacrificing precision.

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Galaxy Dual Controller

Don't replace your AFM — upgrade it. The Galaxy Dual Controller brings cutting-edge capabilities to existing Multimode, 5100, and 5500 systems, unlocking new research possibilities without a full hardware overhaul.

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