Electrical atomic force microscopy (AFM)Map potential, current & resistance at the nanoscale.

Nano-Observer AFMs with our own HD-KFM™ and ResiScope™ modes: single-pass surface potential and quantitative resistance over 10 decades — on hard, soft and fragile samples alike.

Explore electrical modes Let's scan your sample
<1 mV
HD-KFM™
noise level
Molecular
HD-KFM™
resolution
10 decades
resistance range
10² – 10¹² Ω
1 pass
surface potential
+ topography
Nano-Observer II atomic force microscope
HD-KFM surface potential of graphene layers HD-KFM™Graphene 1–4 ML ResiScope doping profile on SiC ResiScope™SiC doping staircase Surface potential of an SRAM Surface potentialSRAM device

Trusted by research labs and industry

  • CNRS
  • Max Planck Society
  • IBM
  • TotalEnergies
  • Kyoto University
  • Toyota

Our specialty

Electrical AFM is what we do best

Electrical characterization is at the core of the Nano-Observer: surface potential, work function, current and resistance, measured quantitatively and simultaneously with topography.
AC · Surface potential

HD-KFM™ III

The most advanced single-pass Kelvin Probe Force Microscopy: harmonic detection and bimodal excitation for high-resolution work-function maps without a lift pass.

  • Sub-surface detection: buried structures, e.g. nanotubes in a polymer
  • Single pass: potential & topography together
  • Tip at 0.1–0.5 nm from the surface
  • dC/dZ & EFC for MFM included
Explore HD-KFM™ III
DC · Resistance & current

ResiScope™ III

Quantitative resistance and current over 10 orders of magnitude, with real-time adaptive electronics that pick the optimal amplifier at every point.

  • 10² to 10¹² Ω in a single scan
  • No saturation on mixed conductive / insulating areas
  • Soft ResiScope™ for fragile samples
Explore ResiScope™ III

The complete electrical toolbox

AFM scan of a P3HT organic film: Soft ResiScope resistance map, 5 µm scan DC · Resistance Soft ResiScope™ Soft ResiScope™ is an innovative AFM mode that enables true quantitative resistance and current measurements on… AFM scan of an SRAM: conductive AFM current map DC · Current Conductive AFM Conductive Atomic Force Microscopy (C-AFM) is an AFM technique that allows for simultaneous measurement of sample… AFM scan of molybdenum: Kelvin force microscopy surface potential map AC · Surface potential Kelvin Force Microscopy Kelvin Force Microscopy (KFM) is a powerful technique in Atomic Force Microscopy (AFM) for mapping surface… AFM scan: electrostatic force microscopy (EFM) map AC · Electric field Electrostatic Force Microscopy Electric Force Microscopy (EFM) is an advanced Atomic Force Microscopy (AFM) technique that allows for high-resolution… AFM scan of a polished PZT sample: piezoresponse force microscopy (PFM) domains AC · Piezoelectricity Piezo Response Force Microscopy Piezoresponse Force Microscopy (PFM) is an Atomic Force Microscopy (AFM) technique that allows for the visualization… AFM scan of an SRAM: scanning microwave impedance microscopy (sMIM), 3D view sMIM · Permittivity & conductivity Scanning Microwave Impedance Scanning Microwave Impedance Microscopy (sMIM) is a revolutionary AFM mode developed by PrimeNano and integrated with…
Beyond electrical: Soft Interaction Control NanoMechanical Magnetic Temperature Liquid & EC-AFM All AFM modes

AFM systems

Nano-Observer Atomic Force Microscopy Systems

From routine surface characterization to advanced nanomechanical and nanoelectrical studies, CSInstruments' AFM lineup is built for cutting-edge research.

Nano-Observer II
Flagship AFM

Nano-Observer II

The next generation of high-performance AFM, engineered for advanced applications demanding the highest precision and complex nanoelectrical analysis.

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AFM controller upgrade

Already have an AFM? Upgrade its controller instead of replacing it

The Galaxy Dual Controller is the AFM controller upgrade made by CSInstruments. It replaces the controller and software of an existing microscope and drives its own head, scanner and stage: every mode the AFM already had is kept, and our electrical and soft modes are added.

Compatible microscopes

  • Bruker (Veeco / Digital Instruments) MultiMode, Dimension 3000 & 3100
  • Agilent / Keysight (Molecular Imaging) 5100, 5400, 5420, 5500, 5600LS
  • Molecular Imaging PicoSPM (STM)

Modes it adds

See the upgrade Is my AFM compatible?

Can I still use my old AFM? Model-by-model answers

Galaxy Dual Controller, AFM controller upgrade by CSInstruments

Customer stories

Installed on site, in our customers' own words

Galaxy upgrades are installed on site by our engineers, with hands-on training for the lab team.

Prof. Jean Jacques Bonvent, UFABC, on the Galaxy Dual Controller upgrade of the lab's Agilent 5500 AFM User testimony · video

UFABC, São Paulo, Brazil: Agilent 5500 AFM upgrade

“The Galaxy Dual truly provided a second life to our existing AFM!”Prof. Jean Jacques Bonvent, UFABC
Read the installation story Kyoto University AFM controller upgrade with the Galaxy Dual Controller Case study

Kyoto University, Japan: MultiMode AFM upgrade

Kyoto University upgraded its MultiMode AFM with the Galaxy Dual Controller, adding advanced modes without replacing the microscope.

Read the case study Your AFM next?

Can I still use my old AFM?

Model-by-model answers for Bruker MultiMode and Dimension, Agilent / Keysight 5100–5600LS and PicoSPM systems.

Check your model

Application notes

Our Advanced Modes In Action

Real measurements, real data: how HD-KFM™, Soft IC and ResiScope™ perform on the samples that matter.

AFM scan of a perovskite solar cell: ResiScope resistance map, resistive grain boundaries and conductive grain interiors Photovoltaics

KPFM on Perovskite Solar Cells

Grain boundary potentials, charge transport heterogeneity, and defect distribution — resolved at sub-10 nm with HD-KFM III and ResiScope™. HD-KFM IIIResiScope™Illuminated KPFM Read application note AFM scan of a polymer battery electrode: HD-KFM surface potential map, 50 × 50 µm Energy Materials

Battery Electrode Characterization

Why standard C-AFM fails on battery materials — and how ResiScope™'s 10-decade range captures pA binder phases and µA active domains in one pass. ResiScope™ IIISoft ResiScope™HD-KFM III Read application note AFM scan of folded hBN: HD-KFM surface potential showing ~100 nm moiré domains, 1 µm scan 2D Materials

HD-KFM for Graphene, hBN & MoS₂

Moiré superlattices in hBN, layer-by-layer work function in graphene, and resistance mapping across 10 decades on MoS₂ — all in one session. HD-KFM IIIResiScope™ Read application note

View all application notes

AFM scan results

Explore results by application field

SRAM (HD-KFM)

Semiconductors

SiC doping profile · SRAM · VO₂ AFM scan of a P3HT organic solar cell: electrical map, 3 µm scan

Energy Materials

Batteries · perovskite · organic PV AFM scan of graphene layers: HD-KFM surface potential distinguishes 1 to 4 monolayers

2D Materials

Graphene · hBN · MoS₂ AFM scan of a block copolymer film

Polymers

Block copolymers · blends · membranes AFM scan of periodically poled lithium niobate (PPLN) showing inverted domains

Materials Science

Alloys · ceramics · coatings Cell (Oscillating mode · 80x80 µm)

Liquid & Biology

Cells · proteins · DNA

News

Latest from CSInstruments

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Talk to a specialist

Have a sample that needs electrical characterization?

Tell us about your material and measurement goal — our application team will recommend the right mode and share relevant scan results, or arrange a demo.